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. 2020 Apr 1;13(7):1605. doi: 10.3390/ma13071605
AES Auger electron spectroscopy
as-dep. as-deposited
EDX energy dispersive X-ray spectroscopy
FIB focused ion beam
HV high vacuum
IDT interdigital transducer
RT room temperature
SAW surface acoustic wave
SEM scanning electron microscopy
TEM transmission electron microscopy
STEM scanning electron transmission microscopy
vdP van der Pauw
XRD X-ray diffraction