Table 1.

Flag-leaf N (FL N_A), stem and remaining leaf N (StL N_A) and ear N (Ear N_A) accumulation; flag-leaf N partitioning index (FL NPI), stem and remaining leaf N partitioning index (StL NPI) and ear N partitioning index (Ear NPI) at anthesis (GS65); and flag-leaf N (FL N_H), stem and remaining leaf N and chaff (StL N_H) and grain N (Grain N_H) accumulation at harvest in 30 wheat cultivars under high N (HN) and low N (LN) conditions. Values represent means in 2014 and 2016.

		FL NA (g N m−2)	StL NA (g N m−2)	Ear NA (g N m−2)	FL NPI	StL NPI	Ear NPI	FL NH (g N m−2)	StL NH (g N m−2)	Grain NH (g N m−2)
HN	Min	1.10	5.78	2.91	0.08	0.54	0.21	0.20	1.30	9.1
	Max	2.23	11.97	6.13	0.16	0.68	0.34	0.43	2.79	16.1
	Mean	1.66	9.10	4.31	0.11	0.61	0.28	0.29	1.88	13.0
LN	Min	0.50	3.61	2.06	0.07	0.52	0.28	0.07	0.53	5.3
	Max	1.04	6.33	4.23	0.13	0.63	0.41	0.17	1.00	8.3
	Mean	0.76	4.64	2.85	0.09	0.56	0.35	0.11	0.80	7.1
SED
N (df 3)		0.07 ***	0.56 **	0.15 **	0.004 **	0.01 *	0.01 **	0.01 ***	0.06 ***	0.41 ***
Gen (df 174)		0.16 ***	0.84 ***	0.35 ***	0.01***	0.02 ***	0.02 ***	0.03 ***	0.22 ***	0.87 ***
N*Gen (df 174)		0.23 ns	1.29 **	0.51 ***	0.01 ns	0.03 ns	0.03 ns	0.04 ***	0.32 **	1.30 *
Y*N*Gen (df 174)		0.33 ns	1.85 ns	0.76 **	0.016 ns	0.042 ns	0.04 ns	0.06 ***	0.46 ns	1.96 ns

^*Significance at the 5% (P = 0.05) level. **1% (P = 0.01) level. ***0.1 % (P = 0.001) level. SED = standard error of the differences of the means.