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. 2020 Apr 24;6(17):eaaz5961. doi: 10.1126/sciadv.aaz5961

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Fig. 2 — (A) SAED patterns of thin films. (B) XRD patterns of thin films. (C) Pseudo-Voight peak fitting of the diffraction peaks for the (121) and (D) (202) crystallographic planes of thin films. Photoelectron spectra from x-ray photoelectron spectroscopy (XPS) and Gaussian peak fitting for (E) Br 3d and (F) Pb 4f core levels.