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. 2011 Aug 27;67(43):8353–8359. doi: 10.1016/j.tet.2011.08.058

Table 5.

Oxidation of silyl enol ether using 2

Entry Substrate Product Yielda,b (%)
1 graphic file with name fx16.gif graphic file with name fx17.gif 93
2 graphic file with name fx18.gif graphic file with name fx19.gif 83
3 graphic file with name fx20.gif graphic file with name fx21.gif 89
4 graphic file with name fx22.gif graphic file with name fx23.gif 92
a

Isolated yield.

b

Purity of product ≥95%.