Fig. 3. Eliminated PV-induced artifact.

a Peak-to-peak magnitude of highpass filtered stimulation artifact recorded on shielded μLED optoelectrodes with different substrate doping densities. Data from channels corresponding to all electrodes on the shank on which an LED was turned on are plotted. Boxes indicate interquartile ranges, white lines medians, whiskers non-outlier extreme values, and black x marks outliers. b Comparison of the mean peak-to-peak magnitude of highpass filtered stimulation artifact whose distribution is shown in part a. Circles indicate the mean, and the error bars indicate one standard deviation. c Mean highpass filtered waveforms whose mean peak-to-peak magnitudes are shown in part b, inside the rectangle with black dashed lines. Shaded regions show one standard deviation away from the mean. The mean (±SD) peak-to-peak magnitudes are 569.33 (±129.00), 474.59 (±146.26), and 146.05 (±143.40) μVpp for devices with FZ-Si substrate (n = 124), p⁻-Si substrate (n = 67), and p⁺-Si substrate (n = 151), respectively. A detailed description of the samples, statistical tests used, and the results of statistical tests are provided in Supplementary Table 2.