Skip to main content
. 2020 Apr 15;36(16):4439–4446. doi: 10.1021/acs.langmuir.9b03536

Figure 2.

Figure 2

XPS characterization of poly(MeOEGMA) brushes: (a) wide-scan spectrum and (b) narrow-scan C 1s spectrum. Poly(CBMA) brushes: (c) wide-scan spectrum with the narrow-scan spectrum (inset) of the N 1s region and (d) narrow-scan C 1s spectrum. Poly(HPMA) brushes: (e) wide-scan spectrum and (f) narrow-scan C 1s spectrum.