Table 3. Data collection and processing.
Diffraction source | Beamline 1W2B, BSRF |
Wavelength (Å) | 1.0000 |
Temperature (K) | 100 |
Detector | SX165 |
Crystal-to-detector distance (mm) | 124.3 |
Rotation range per image (°) | 1 |
Total rotation range (°) | 360 |
Exposure time per image (s) | 10 |
Space group | C2 |
a, b, c (Å) | 60.10, 63.20, 66.90 |
α, β, γ (°) | 90, 105.00, 90 |
Mosaicity (°) | 0.362 |
Resolution range (Å) | 32.9–1.9 (1.95–1.90) |
Total No. of reflections | 138682 (9763) |
No. of unique reflections | 18481 (1291) |
Completeness (%) | 96.64 (94.13) |
Multiplicity | 7.5 (7.56) |
〈I/σ(I)〉 | 25.03 (8.91) |
R r.i.m. | 0.05 |
Overall B factor from Wilson plot (Å2) | 10.8 |