Figure - PMC

Skip to main content

An official website of the United States government

Here's how you know

Here's how you know

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you've safely connected to the .gov website. Share sensitive information only on official, secure websites.

View full-text article in PMC

. 2020 May 1;11:2136. doi: 10.1038/s41467-020-15974-7

Search in PMC
Search in PubMed
View in NLM Catalog
Add to search

© The Author(s) 2020

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

PMC Copyright notice

Fig. 4 — a, b Box-plot statistics for the OFET mobility and hole trap density, respectively, obtained from ten devices of each TIPS-pentacene:PS blend ratio (1:0, 4:1, 2:1, and 1:1). c Device X-ray sensitivity of 1:0, 4:1, 2:1, and 1:1 TIPS-pentacene: PS devices. The error bars refer to the statistical fluctuations of the parameters over ten samples for each blend ratio. Comparison between pure TIPS-pentacene (1:0) and blended (4:1) devices of: d experimentally determined mobility and e corresponding transit time; analytically determined f photoconductive gain and g recombination time, for different deposition speeds. The error bars refer to the statistical fluctuations of the parameters over four samples for each deposition speed.