TABLE 5.

Results of test-retest reliability analyses within device and test frequency.

Frequency [Hz]	Device	rhot1,t2	p	95% CI
125	app	0.728	<0.001	[0.638; 0.799]
	AM	0.614	<0.001	[0.497; 0.709]
250	app	0.747	<0.001	[0.663; 0.814]
	AM	0.74	<0.001	[0.652; 0.807]
500	app	0.831	<0.001	[0.770; 0.877]
	AM	0.781	<0.001	[0.706; 0.839]
750	app	0.763	<0.001	[0.683; 0.826]
	AM	0.798	<0.001	[0.728; 0.852]
1000	app	0.75	<0.001	[0.665; 0.815]
	AM	0.719	<0.001	[0.627; 0.792]
1500	app	0.750	<0.001	[0.666; 0.815]
	AM	0.736	<0.001	[0.647; 0.804]
2000	app	0.84	<0.001	[0.782; 0.883]
	AM	0.754	<0.001	[0.670; 0.818]
3000	app	0.843	<0.001	[0.786; 0.886]
	AM	0.853	<0.001	[0.799; 0.893]
4000	app	0.899	<0.001	[0.861; 0.927]
	AM	0.868	<0.001	[0.82; 0.904]
6000	app	0.857	<0.001	[0.805; 0.896]
	AM	0.825	<0.001	[0.763; 0.872]
8000	app	0.919	<0.001	[0.888; 0.941]
	AM	0.902	<0.001	[0.865; 0.929]