Table 6:
Repeat content of assemblies
| No. | Assembly name | % Masked | % SINEs | % LINEs | Mean divergence |
|---|---|---|---|---|---|
| A1 | w2rap | 38.31 | 8.99 | 20.53 | 24.52 |
| A2 | w2rap-lmp | 37.24 | 8.75 | 19.95 | 24.56 |
| A3 | 10x | 39.49 | 9.81 | 20.73 | 24.53 |
| A4 | 10x-lmp | 39.10 | 9.71 | 20.52 | 24.54 |
| A5 | w2rap-bionano | 35.82 | 8.40 | 19.20 | 24.52 |
| A6 | w2rap-lmp-bionano | 36.79 | 8.64 | 19.71 | 24.52 |
| A7 | 10x-bionano | 39.11 | 9.72 | 20.53 | 24.60 |
| A8 | 10x-lmp-bionano | 38.89 | 9.66 | 20.41 | 24.58 |
| A9 | w2rap 10x | 38.32 | 8.99 | 20.54 | 24.55 |
| A10 | w2rap_lmp_bionano_10x | 36.79 | 8.64 | 19.70 | 24.53 |
% Masked refers to the amount of the genome masked for all repeats, % SINEs and % LINEs reflect the percentage of the genome found to contain each of these classes, and mean divergence is calculated as “mismatches/(matches + mismatches)” between queries and matches for all repeats.