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. 2020 Apr 15;20(8):2228. doi: 10.3390/s20082228
AFM Atomic Force Microscope
ATR Attenuated Total Reflection
BSA Bovine Serum Albumin
CAG Contact Angle Goniometry
CV Cyclic Voltammetry
DPA Dipicolylamine
ESCA Electron Spectroscopy for Chemical Analysis
FET Field-effect Transistor
FT-IR Fourier Transform Infrared Spectroscopy
IRAS Infrared Reflection-Absorption Spectroscopy
KFM Kelvin Force Microscope
LB Langmuir–Blodgett
LbL Layer-by-Layer
LOD Limit of Detection
MeCN Acetonitrile
PBA Phenylboronic Acid
PYS Photoemission Yield Spectroscopy
QCM Quartz Crystal Microbalance
SAM Self-assembled monolayer
SAW Surface Acoustic Wave
SERS Surface-enhanced Raman Scattering
SPR Surface Plasmon Resonance
STM Scanning Tunneling Microscope
SWV Square Wave Voltammetry
TAMRA 5-Carboxytetramethylrhodamine
TESBA 4-(Triethoxysilyl)butyraldehyde
UPS UV Photoemission Spectroscopy
VOC Volatile Organic Compound
XPS X-ray Photoelectron Spectroscopy