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. 2020 Mar 28;10(4):633. doi: 10.3390/nano10040633

Figure 4.

Figure 4

Atomic force microscopy (AFM) image and the AFM height differences between the single AgNW junction and the double AgNW junction (a) with 20 AgNW spray coatings (before pressurizing) and (b) the AgNW nanomesh after pressurizing with 2000 N/cm2.