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. 2020 Apr 4;9(4):1019. doi: 10.3390/jcm9041019

Figure 4.

Figure 4

(A) The superficial composition of new SS drills without any treatment, by Energy-Dispersive X-ray Spectroscopy (EDX) analysis (keV = kilo-electron-volt, accelerating voltage range used for EDX analysis; cps/eV: counts per second per electron-volt). (B) The atomic percentage (%), that represent the % concentration of each element on the same sample.