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. 2020 Apr 10;11(4):397. doi: 10.3390/mi11040397

Figure 1.

Figure 1

(a) Comparison of 3D nanoprinting via focused electron beam-induced deposition (FEBID) and focused ion beam-induced deposition (FIBID) to other sub-10-μm metal additive manufacturing methods within the speed-size parameter space. The acronyms stand for direct ink writing (DIW), electrohydrodynamic printing (EHD), laser-induced forward transfer (LIFT), the electroplating of locally dispensed ions in liquid–atomic force microscopy (AFM), and cantilever-based (FluidFM) and glass capillary-based scanning ion conductance microscope (SICM). The potential of multi-beam versus single beam FEBID/FIBID is indicated. Modified from Hirt et al. [1]. (b,c) Examples of 3D FEBID. (b) Reprinted from Winkler et al. [7], with the permission of AIP Publishing. (d) Example of 3D FIBID structure. Modified from Matsui et al. [8].