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. 2020 Apr 27;21(9):3085. doi: 10.3390/ijms21093085

Figure 4.

Figure 4

Atomic force microscopy (AFM) images recorded on a scan size of 500 × 500 nm2 in air AC mode of phase (upper panels) and height (middle panels) with related section analysis curves (lower panels) for: (a) bare AuNP, (b) HA-capped AuNPs with HA 200 kDa and (c) HA-capped AuNPs with HA 700 kDa.