| CR | Cold rolling |
| CSL | Coincident site lattice |
| EBSD | Electron back scattering diffraction |
| GOS | Grain orientation spread |
| KAM | Kernel average misorientation |
| ND | Normal direction |
| OIM | Orientation imaging microscopy |
| TD | Transverse direction |
| TEM | Transmission electron microscope |
| UFG | Ultrafine-grain |
| UTS | Ultimate tensile strength |
| WR | Warm rolling |
| b | Burgers vector |
| D | Grain size |
| d | OIM step size |
| Ky | Grain size strengthening factor |
| r | Radius of boundary curvature |
| G | Shear modulus |
| V | Rate of grain boundary migration |
| VA | Atomic volume |
| α | Numerical factor |
| γ | Boundary surface energy |
| δ | Total elongation |
| ρ | Dislocation density |
| σ0.2 | Yield strength |
| σ 0 | Strength of dislocation-free single crystal |
| τ | Annealing time |
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