Skip to main content
. 2020 Apr 27;13(9):2039. doi: 10.3390/ma13092039
AES Auger electron spectroscopy
EDX energy dispersive X-ray spectroscopy
FIB focussed ion beam
HV high vacuum
ML multilayer
SAW surface acoustic wave
SEM scanning electron microscopy
STEM scanning electron transmission microscopy
XPS X-ray photoelectron spectroscopy
XRD X-ray diffraction