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. 2020 May 29;10:8772. doi: 10.1038/s41598-020-65225-4

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© The Author(s) 2020

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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(a) Energy-dispersive x-ray absorption spectroscopy (XAS) setup at the Munich Compact Light Source (MuCLS). (b) Hard x-rays are produced in the process of inverse Compton scattering (ICS). (c) Three exemplary MuCLS source spectra at 15, 25, 35 keV configurations with bandwidths of 3.0% 3.6% and 4.3% (FWHM), respectively. The small peak visible for the 35 keV spectrum at 25 keV is due to the Sn-Kα fluorescence line of the solder from the Amptek X-123 detector. For comparison, simulated x-ray tube spectra for W and Cu anodes are plotted (intensity scaled by a factor of 100).