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. 2020 Jun 2;86(12):e02971-19. doi: 10.1128/AEM.02971-19

TABLE 1.

Crystallographic data collection and model refinement statistics

Parameter Se-Met PytH_PMS PytH_BIF PytH_H230A PytH_S78A
PDB code 5Y57 5Y5R 5Y51 5Y5V
Data collection 5/31/2013 7/12/2013 3/15/2013 10/15/2013 1/1/2015
    Wavelength (Å) 0.9791 0.9792 0.9793 0.9793 0.9791
    Temp (K) 100 100 100 100 100
    Crystal-to-detector distance (mm) 300 300 250 300 400
    Rotation range/image (°) 1.0 1.0 1.0 1.0 0.5
    Total rotation range (°) 720 150 360 90 360
    Space group P42212 P42212 P42212 P42212 P42212
    Cell dimensions
        a, b, c (Å) 169.02, 169.02, 123.53 168.2, 168.2, 123.4 168.86, 168.86, 123.86 168.38, 168.38, 123.86 168.20, 168.20, 123.63
        α, β, γ (°) 90 90 90 90 90
    Resolution range (Å) 20.00–1.96 (2.07–1.96) 20.0–1.96 (2.07–1.96) 19.92–1.90 (2.00–1.90) 20.0–2.30 (2.42–2.30) 20.0–2.98 (3.14–2.98)
    No. of observed reflections 7,152,139 (682,781) 1,467,707 (145,072) 4,159,477 (602,839) 580,253 (85,039) 358,416 (52,344)
    No. of unique reflections 125,139 (16,305) 125,394 (16,979) 140,256 (20,268) 75,180 (11,027) 36,638 (5,259)
    Multiplicity 57.2 (41.9) 11.7 (8.5) 29.7 (29.7) 7.7 (7.7) 9.8 (10.0)
    Rpim (%)a 3.7 (28.6) 6.3 (69.9) 5.5 (41.8) 6.3 (37.4) 9.3 (33.2)
    Completeness (%) 98.3 (88.9) 98.9 (92.9) 99.9 (100) 95.4 (97.0) 99.7 (100.0)
    I/δ〈I 12.0 (2.6) 9.2 (1.2) 9.1 (2.1) 8.0 (1.9) 7.1 (2.2)
Structure refinement
    Total no. of atoms 11,971 12,042 11,410 11,233
    No. of reflections used 125,199 139,583 74,976 36,595
    Rwork (%) 25.5 27.3 27.0 22.4
    Rfree (%) 30.9 32.2 32.6 28.8
    RMSD bond length (Å) 0.0093 0.011 0.0112 0.010
    RMSD angles (°) 1.144 1.461 1.263 1.368
Ramachandran plot (%)
    Favored 94.4 97.2 94.8 92.5
    Allowed 5.6 2.8 5.2 7.3
    Outlier 0 0 0.0 0.2
a

Precision-indicating merging R factor, i.e., Rpim = ∑hkl[1/(N − 1)]1/2i|Ii(hkl) − [I(hkl)]|/∑hkl ∑[I(hkl)], where Ii(hkl) and I(hkl) are the observed intensity of measurement i and the mean intensity of the reflection with indices hkl, respectively, and N represents increased redundancy of the measurement.