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. 2020 Jun 8;11:2883. doi: 10.1038/s41467-020-16678-8

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© The Author(s) 2020

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 4 — a Schematics of the specific arrangement of cAuNRs in the plasmonic film. b Top views of the plasmonic films under different rotation angles. c Top views of the plasmonic films under different bending angles. d The transverse excitation of cAuNRs under different transverse phase angles (ɸ_T). e Schematics showing the in-plane 45° arrangement of cAuNRs inside the plasmonic film at the top (top) and side view (bottom). f Schematics of left-handed twist (top) and right-handed twist states (bottom). The twisting angle is set at 540°. g Digital images of the plasmonic film at initial (top panel), left-handed (middle panel), and right-handed twisting states (bottom panel). The polarization direction and orientation of cAuNRs are illustrated by red and black arrows, correspondingly. h Dependence of transverse excitation on localized rotation angle and y-coordinates by analyzing the superposition of intensity of transverse and longitudinal resonances to the overall lineshape. Insets: a picture of the twisted plasmonic film and the helical configuration of cAuNRs. i CD spectra of pure polymer and plasmonic films under twisted configuration. Error bars in d and h represent the standard deviations from three experimental measurements.