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. 2020 Mar 16;27(Pt 3):625–632. doi: 10.1107/S1600577520002192

Figure 2.

Figure 2

Two cases of the experimental setup. (a) The X-ray beam propagated through the slit and its profile was measured alternatively by the LiF crystal detector or the pre-calibrated photodiode. (b) Scanning of the intensity distribution of the X-ray beam propagated through both the slit and the pinhole in different planes along the Z axis using the LiF crystal detector.