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. 2020 Jun 9;6(6):e04177. doi: 10.1016/j.heliyon.2020.e04177

Table 2.

Fitting parameters of our newly derived model applied to PVC-PS and PVC-PS-SiO2 NPs with different concentrations of SiO2 NPs thin films.

Sample Eg(eV) d(nm) A B C
PVC-PS 3.835 ± (0.01687) 292.597 ± (5.1412) 0.0319 ± (5.14E-6) 8.057 ± (0.0010) 16.137 ± (0.0208)
PVC-PS- 5% SiO2 3.961 ± (0.01118) 306.035 ± (4.1524) 0.0351 ± (4.79E-6) 11.451 ± (0.0012) 28.633 ± (0.0424)
PVC-PS- 10% SiO2 4.133 ± (0.01547) 302.351 ± (7.1551) 0.0372 ± (2.48E-6) 13.757 ± (0.0016) 29.351 ± (0.0357)