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. 2020 May 23;13(10):2404. doi: 10.3390/ma13102404
AM additive manufacture
LOUD detection laser opto-ultrasonic dual detection
WAAM wire + arc additive manufacturing
EBSD electron backscatter diffraction
XRD X-ray diffraction
CCD charge-coupled device
SBR signal-to- background ratio
DAQ data acquisition card
DDG digital delay generator
VP CMT variable polarity cold metal transfer