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. 2020 Jun 18;10:9919. doi: 10.1038/s41598-020-66916-8

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© This is a U.S. Government work and not under copyright protection in the US; foreign copyright protection may apply 2020

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Comparisons of XFM-calculated ion conductivity (σ) for the S2 secondary cell wall layer and compound middle lamella (CML) using the Nearnst-Einstein relationship (Eq. 2) and average RH-dependent KCl diffusion constants (Fig. 6). Also included are σ measurements in the S2 and corner CML (CCML) from Zelinka and coworkers⁶³.