Secondary salivary conditioning film (S-SCF) change in
composition, measured using X-ray photoelectron
spectroscopy (XPS), in topography and nanofriction,
measured by atomic force microscopy (AFM) and colloidal
probe. (A) Surface topography of bare
Au-coated crystal and S-SCF treated with buffer,
Chi-C7.6%, Chi-C14.5%, and
Chi-C22.4%, respectively.
(B) The amount of glycoprotein (%O) in S-SCF
with buffer or different conjugate degree Chi-C treatment
was obtained from decomposition of O1s
photoelectron peak in XPS. (C) Friction force
versus applied load curves of bare quartz crystal
microbalance with dissipation (QCM-D) crystal and S-SCF
treated with buffer or Chi-C, respectively.
(D) Coefficient of friction (COF) of
each S-SCF calculated by slope of the linear fitting.
(E) Correlation between structural
softness of S-SCF and COF, and the higher structural
softness of S-SCF the lower COF of S-SCF in vitro with
colloidal probe AFM was achieved. *Statistically
significant differences (P < 0.05) in
the content of glycoprotein in S-SCF with Chi-C treatment
with respect to S-SCF with buffer treatment in (B), or in
COF between S-SCF and bare crystal in (D).
#Statistically significant (P
< 0.05) difference in COF of S-SCF treated with Chi-C
respect to S-SCF treated with buffer.
&Significant difference in COF between
S-SCF with Chi-C22.4.% and Chi-C7.6%
treatment, respectively. Chi-C, chitosan-catechol.