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. Author manuscript; available in PMC: 2020 Jul 7.
Published in final edited form as: IEEE Trans Reliab. 2018 Aug 7;68(1):248–266. doi: 10.1109/tr.2018.2835140

TABLE III.

Number of Failures per Type of Via and Copper Wrap Thickness

0.0 mil Wrap 0.2 mil Wrap 0.5 mil Wrap
14 Layer Via 12 12 12
7 Layer Via 4 6 0 after 1500* Cycles
1 Layer Via 0 after 1500 Cycles 0 after 1500 Cycles 1
*

-test was suspended