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. 2020 Jun 8;10(6):1135. doi: 10.3390/nano10061135

Figure 6.

Figure 6

(a,b) Normalized electric field intensity in the xz-plane under different incident wavelengths ranging from 4 µM to 6 µM for MDLs with reflection and transmission, respectively. (c) Normalized distribution of electric field intensity of different incident wavelengths on the propagation plane (x = 0). (d) Simulated positions of focal (symbols) for MDLs with reflection and transmission compared to conventional diffraction lens (lines) at different wavelengths in infrared spectrum.