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. 2020 Jun 17;10(6):1184. doi: 10.3390/nano10061184

Figure 9.

Figure 9

SEM micrograph of LSFL-II on top of the ridge of ridge-like DLIP structure with a period of 10 μm (DLIP-type 3) processed with the Time-Bandwidth Fuego laser system. This sample was contaminated.