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. 2020 May 31;10(6):1076. doi: 10.3390/nano10061076

Figure 3.

Figure 3

Transmission electron microscopy (TEM) images of the nanoparticles (scale bar = 300 nm, inserts show SPIONs at higher magnification) (a) and atomic force microscopy (AFM) topographical and phase images of SPIONs and SPION@mSiO2 (scale bar = 200 nm) (b).