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. 2020 Jun 22;3(7):6774–6784. doi: 10.1021/acsanm.0c01190

Figure 2.

Figure 2

Representative EFDP-generated topological overview. Cross-section AFM profiles, top-view OM images, SEM micrographs, and DNN images of the EFDP generated structures. Corresponding SERS enhancements are shown in Figure 3d. (a) Pillar with Hrim = 250 nm and a nanoroughened center, EF = 9.0 × 106. (b) Pillar with an equivalent nanorim of Hrim = 300 nm and a roughened center, EF = 1.1 × 107. (c) Pillar with a one-sided nanorim of Hrim = 270 nm and a roughened center, EF = 8.8 × 106. (d) Pillar with nanoroughness throughout and no rim, EF = 6.4 × 106. (e) Smooth pillar with one-sided nanorim of Hrim = 200 nm, EF = 6.1 × 106. (f) Pillar with a nanorim of Hrim = 150 nm, EF = 6.7 × 106. (g) Smooth pillar top with no rim, EF = 5.8 × 106. Scale bar SEM: 1 μm.