Figure 7.

(a) Inverse pole figure [001] obtained by SEM-EBSD measurement on an annealed Cu thin film shows a {111} texture; the two twin-related grain orientation variants are distinguished by subtle contrast variations (GB marked by white lines). (b) Cross section SEM image reveals a GB aligned normal to surface; the arrow points toward the GB. (c) SEM image of a line within the thin film with the four needles for resistivity measurement. The SEM image is correlated with EBSD resolved in-plane directions to reveal the GBs.