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. 2020 Jul 16;25(14):3238. doi: 10.3390/molecules25143238

Figure 3.

Figure 3

Representative atomic force microscopy (AFM) images of about 50–180 nm thick spin-coated films of (a) cellulose (CL), root mean square (RMS) roughness is 6.59 nm; (b) nylon, RMS roughness is 1.17 nm; and (c) PET, RMS roughness is 2.19 nm on the surface of the Si-wafers.