Fig. 3. AHE in KV₃Sb₅.

(A) Angular dependence of σ_AHE at 2 K as the μ₀H is tilted from out-of-plane to in-plane. The inset shows the σ_AHE against cos(θ). (B) Extracted σ_AHE versus ${\mathrm{\sigma }}_{\mathit{xx}}^2$ for various devices with thickness ranging from 30 to 128 nm. Solid lines are fittings to the equation shown in the inset to extract the skew scattering constant (α) and intrinsic AHC (b) for each device. The inset shows the extracted intrinsic σ_AHE for all six devices. Larger error is seen for samples 1 to 3 due to the size of the dominating extrinsic component. (C) The ratio between σ_AHE and σ_xx for six KV₃Sb₅ devices and for Fe. The black lines guide the eye to illustrate the increasing tendency of σ_AHE/σ_xx for KV₃Sb₅ and for Fe.