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. 2020 Jul 30;53(Pt 4):957–971. doi: 10.1107/S1600576720008420

Figure 14.

Figure 14

(a) A schematic diagram of the sample environment for in situ ptychography with a limited tilting angle, including the MEMS chip sample holder (Fam et al., 2019). (b) A SEM image acquired during FIB–SEM showing a CoMn2O4 spinel ‘hollow-sphere’ particle of approximately 3 µm diameter attached to the viewing window of the MEMS chip.