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. 2020 Jul 30;53(Pt 4):957–971. doi: 10.1107/S1600576720008420

Figure 6.

Figure 6

Characterization of a nanofocused X-ray beam by ptychography using the previous nanoprobe setup on beamline P06. (a) The illumination and object function were reconstructed using the ePIE algorithm. (b) Caustics of the nanofocused X-ray beam in the vertical and horizontal planes.