Figure 6.

The rates $Im{k}_{\perp d}\left(\hslash \omega \right)$ and $Im{k}_{\perp m}\left(\hslash \omega \right)$ (Equations (11) and (12)) which are the measure of SPP localization from the dielectric and metal side of the interface for gold (a) and silver (b) of properties represented by various models of the dielectric functions. Blue line represents the most reliable localization rates found for ${\epsilon }_m\left(\hslash \omega \right)$ accounting for ohmic losses and interband transitions in realistically described gold (a) and silver (b).