Fig. 1.
(a) SEM images of NS1, NS2, NS3, and NS4 with the insets showing the corresponding cross-sectional images; (b) TEM image of the nanorod separated from NS4; (c) XPS survey spectrum and high-resolution spectra of Ti 2p and O1s of the TiO2 nanostructures; (d) XRD patterns of the TiO2 nanostructures; (e) Root-mean-square roughness values of NS1, NS2, NS3, and NS4 determined by AFM; (f) Contact angles on the TiO2 nanostructures.
