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. 2020 Aug 13;10:13762. doi: 10.1038/s41598-020-70801-9

Figure 3.

Figure 3

(a) Cross section STEM-HAADF image with the superimposed composition profile of Pt, Cd and Te. (bd) Pt, Cd and Te EDX maps of the same region. (e) High Resolution TEM of the MeOH/DMF Pt contact with the Fast Fourier transform of the PtTe2 layer in the inset.