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. 2020 Aug 1;13(15):3402. doi: 10.3390/ma13153402

Figure 5.

Figure 5

X-ray photoelectron spectroscopy (XPS) depth profiling results of the passive layer of (a) mechanically polished and (b) electropolished 18Cr21Mn2NiN stainless steel, 91.6 s ≈ 1 nm. p.l.—passive layer; int.—interface between passive layer and bulk metal; bulk—bulk metal.