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. 2020 Jul 29;6(31):eaba8761. doi: 10.1126/sciadv.aba8761

Fig. 2. Simulated results of the far-field pattern of devices 1 and 2.

Fig. 2

(A and B) Calculated total and LCP and RCP intensities of the far-field scattering patterns for devices 1 (A) and 2 (B), respectively. The total intensity is the sum of LCP and RCP components. Note that the intensities of LCP and RCP in device 1 are multiplied by 2 to use the same color bar with the total far-field intensity. a.u., arbitrary units.