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. 2020 Aug 25;11:4251. doi: 10.1038/s41467-020-18091-7

Fig. 1. Characterization of the obtained samples.

Fig. 1

a HAADF-STEM and b magnified HAADF-STEM images of Ti3C2Tx-250. c STEM-EDX elemental mapping of Ti3C2Tx-250. d Ti K-edge XANES spectra for Ti3C2Tx-25, Ti3C2Tx-150, Ti3C2Tx-250, and Ti3C2Tx-350. The wavelet transform analysis in Ti K-edge for e Ti3C2Tx-250 and f Ti3C2Tx-350. g EXAFS spectra in R space for Ti3C2Tx-25, Ti3C2Tx-150, Ti3C2Tx-250, and Ti3C2Tx-350. Ti foil, TiO2, and TiC were used as references.