Instrument schematic of a nonlinear optical beam-scanning microscope used for multiphoton FT-FRAP. An HWP on a flip mount was used to modulate from low power (∼50 mW) to high power (∼500 mW) for the photobleach. Beam scanning was performed with galvanometer (slow axis) and resonant (fast axis) mirrors. DCM, dichroic mirror; HWP, half-wave plate; PMT, photomultiplier tube; SPF, short-pass filter; TPEF, two-photon excited fluorescence. To see this figure in color, go online.