Dilution effects on critical formation concentration of SELPs 815K- RS1, 815K-RS2, and 815K-RS5 and the CMC of SDS control. a) CFC determination plot of 815K- RS1 undergoing no dilution, 2x dilution, and 4x dilution. Arrow indicates shifting CFC upon dilution. b) Effect of dilution on CFCs of SELP constructs. Arrow highlights the lack of CFC shift upon dilution. c) CMC determination plots using 1,8- ANS of SDS undergoing no, 2x, and 4x dilutions. d) Bar graph plot of calculated SDS CMC at varying dilutions. Data plotted as mean ± standard deviation; n = 3. *, p < 0.05; ***, p < 0.001.