Loading of DOX within SELP nanoassemblies. (a) Schematic of handheld tangential flow filtration system utilized to remove free DOX. (b) DOX concentration in the eluent vs. elution volume for SELPs 815K, 815K-RS1, and 815K-RS2. (c) Drug loading and drug loading efficiency percentages for the tested SELPs. (d) Scanning electron micrographs of DOX-loaded SELPs (left) 815K, (middle) 815K-RS1, and (right) 815K-RS2. Data plotted as mean ± standard deviation; n = 3. *, p < 0.05; ***, p < 0.001. Scale bar = 400 nm.