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. 2020 Aug 28;11:4346. doi: 10.1038/s41467-020-18212-2

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© The Author(s) 2020

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 1 — a Schematic and b SEM image of the nanofiber junction suspended on the thermometer microdevice consisting of two measurement islands. Scale bar: 10 μm. As illustrated in a, one portion of the suspended nanofiber is exposed to e-beam irradiation from the back side of the thermometer microdevice to make the irradiated-pristine nanofiber junction. c Zoomed-in SEM image of the nanofiber junction in false colors: purple (irradiated section) and green (pristine crystalline section). Scale bar: 2 μm. d Influence of e-beam irradiation on the phase transition behavior of PE nanofibers. The error bar means the standard deviation of thermal conductance data from the Wheatstone measurement.