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. 2020 Jul 1;12(7):e620–e625. doi: 10.4317/jced.56616

Figure 2.

Figure 2

Atomic force microscope (AFM) images used for estimating the surface roughness parameter (Ra). A, C and E are the three dimensional images of 3 control samples of RMGI, BIR and CGI respectively; B, D and F are the two dimensional images of the corresponding samples.