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. 2020 Sep 1;10:14411. doi: 10.1038/s41598-020-71416-w

Figure 1.

Figure 1

Cantilever twist recording during the AFM-scanning Si (100) surface, thin Au film and nanostructured Ni80Fe20 film obtained in SP-mode (a) and schematic representation of the AFM-probe behavior during scanning (b) with an idealized graph of the twist angle (c).