Skip to main content
. 2020 Jul 31;12(8):1726. doi: 10.3390/polym12081726
B full width at half maximum
d distance between crystallographic planes (d-spacing)
LD diffusion length
Mn number average molecular weight
Mn,1 or 2 number average molecular weight of component 1 or 2
Mw weight average molecular weight
MWs molecular weight of a solvent
P pressure
PA polymer acceptor
PD polymer donor
R the gas constant
r1 or 2 relative molar volume of component 1 or 2
T temperature
Tc crystallization temperature
Tg glass transition temperature
Tm melting temperature
t crystallite size
V^s molar volume of a solvent
ΔGm Gibbs free energy of mixing
ΔHm enthalpy of mixing
ΔSm entropy of mixing
δ solubility parameter
δi or j solubility parameter of component i or j
θ diffraction angle
λ X-ray wavelength (= 0.154 nm)
μn electron mobility
ϕi volume fraction of component i
ρ1 or 2 or s density of component 1 or 2 or solvent
χ Flory–Huggins interaction parameter
χij Flory–Huggins interaction parameter between component i and j
(χ12)crit Flory–Huggins interaction parameter between component 1 and 2 at critical point
AFM atomic force microscopy
all-PSCs all-polymer solar cells
CB chlorobenzene
CF chloroform
DCO 1,8-dichlorooctane
DIO 1,8-diiodooctane
DMA dynamic mechanical analysis
DSC differential scanning calorimetery
FWHM full width at half maximum
L–L liquid–liquid
L–S liquid–solid
NBR butadiene/acrylonitrile copolymer
NG nucleation and growth
ODT 1,8-octanedithiol
OPV organic photovoltaics
OTFT organic thin-film transistor
P(NDI2OD-T2) poly{(N,N′-bis(2-octyldodecyl)naphthalene -1,4,5,8-bis(dicarboximide)-2,6-diyl)-alt-5,5′-(2,2′-bithiophene)}
PCE power conversion efficiency
PCPDTBT poly[2,6-(4,4-bis(2-ethylhexyl)-4H-cyclopenta [2,1-b;3,4-b′]dithiophene) -alt-4,7(2,1,3-benzothiadiazole)]
PDI polydispersity index
PPO polystyrene-poly(2,6-dimehtyl -1,4-phenylene oxide)
PVC poly(vinyl chloride)
r-reg P3HT regioregular poly(3-hexylthiophene-2,5-dyil)
SD spinodal decomposition
TGA thermogravimetric analysis
TGBC top-gate bottom-contact
UCST upper critical solution temperature
XRD X-ray diffraction