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. 2020 Jul 30;10(8):1495. doi: 10.3390/nano10081495

Figure 1.

Figure 1

(a) Refractive index n (black solid line) and extinction coefficient κ (blue dashed line) of the silicon suboxide film measured as a function of the wavelength λ. (b) Photograph of the film on a fused silica substrate 25 mm in diameter.