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. 2020 Jul 30;10(8):1495. doi: 10.3390/nano10081495

Figure 4.

Figure 4

SEM image (top) and Fourier spectrum (bottom) of the silicon suboxide films irradiated with (a) N = 250, (b) N = 500, and (c) N = 1000 fs laser pulses at F = 675 mJ/cm2. E denotes the direction of the polarization.